月亮词典
首页
查询
ellipsometry
英音[ ɪlɪpˈsɒmɪtri ] 美音[ ɪlepˈsɑːmətrɪ ]
椭偏
常用释义
词性释义
n.
椭圆对称;椭圆光度法,[光] 椭圆测量术
例句
全部
椭偏
Owing to its advantages
,
ellipsometry
and
automatic
ellipsometers can be
used
in
many
other
fields
and
will
gain
good
results
.
并且,自动椭偏仪在其他领域的测量应用前景也很好。
The electro
-
optic
index
of
PLZT
thin films
was
measured
by
means of
modulated
ellipsometry
.
利用调制式的椭偏仪测量了掺镧锆钛酸铅PLZT薄膜的电光系数。
To attain
high
precise
optical
parameters
of
thin films
, it
's
necessary to solve
data processing
in
ellipsometry
.
数据处理一直是椭偏测量术获取高精度薄膜结构参数的一个难点。
Imaging
technique
,
interferometric
method
and
ellipsometry
are
used
in
the
defect
detection
of
the
thin film
.
在薄膜缺陷检测领域,成像技术,干涉测量,椭偏测量等一系列测量手段都得到了应用。
SCI
offers
diverse
tools
for
optical
thin
film
design
,
material
analysis
,
ellipsometry
, and
spectrophotometry
.
为薄膜设计,材料分析,椭圆偏光法,分光光度测定法提供不同的工具。最近的光学薄膜软件包括:一。
Spectroscopic
imaging
ellipsometry
(SIE) is used to
characterize
a
nano
film
pattern
on
a
solid
substrate
.
提出一种对固相基底上纳米薄膜图案进行表征的光谱椭偏成像系统。
Study
on
optical
properties
of
diamond
films
by means of
infrared
spectroscopic
ellipsometry
金刚石薄膜的红外椭圆偏振光谱研究
Paints
quality
,
Plastics
,
Polymer
,
Optical Brighteners
and
Phosphor
Coatings
(
Ellipsometry
)
油漆质量,塑料,聚合物,荧光增白剂和磷涂层(椭圆偏振仪)
Research
on
dynamic
reflecting
spectroscopic
ellipsometry
and its
application
in
the
measurement
of
thin films
动态椭偏光谱技术及其在薄膜测量中应用的研究
Automatic
Ellipsometry
Measurement
Instrument
for
Anisotropic
Materials
各向异性材料光学常数全自动椭偏测仪
Study
of
heterodyne
ellipsometry
for
nanometer
film
measurement
纳米厚度薄膜外差椭偏测量技术的研究
Study
on
Aniline
Electrochemical
Polymerization
with
Potential
Scanning
Ellipsometry
电位扫描椭圆法对苯胺电聚合的研究
Spectroscopic
Ellipsometry
Investigations
of
Amorphous
Diamond
Films
Deposited
with
Filtered
Arc
过滤电弧沉积非晶金刚石薄膜的光谱椭偏研究
Study
of
fabrication
and
spectroscopic
ellipsometry
of SBN
thin films
铌酸锶钡薄膜制备及椭偏光谱研究
Spectroscopic
Ellipsometry
Theory
of
Anisotropic
Thin Films
各向异性择优取向薄膜的椭偏光谱术理论
Direct
Calculation
Method
of
Measuring the Reflective
Index
and
the
Thickness
of the
Rough
-
Surface
Films
by
Ellipsometry
直接计算法计算粗糙面薄膜的折射率和厚度
Packaging
:
Barrier
Coating
for
Food
Plastic
Films, Bottles
(
Ellipsometry
)
包装:食物包装用塑料膜、瓶子的保护涂层(椭圆偏振仪)
Improving
ellipsometry
precision
by
correctly
using
multi-times
measurement
正确使用多次测量法提高椭偏测量精度
Effects
of
deposition
conditions
on
infrared
spectroscopic
ellipsometry
of CVD
diamond
films
沉积工艺条件对金刚石薄膜红外椭偏光学性质的影响
Advanced
Characterization
of
Thin Film
by Spectroscopic
Ellipsometry
椭圆偏光光谱仪:先进的薄膜表征方法
Study
on
Heterodyne
Transmission
Ellipsometry
and
Nonlinearity
Error
透射式外差椭偏测量及非线性误差分析
The
optical
constants
of
GaN
film
investigated
by
spectroscopic
ellipsometry
GaN薄膜光学常数的椭圆偏振光谱研究
GaN
epilayer
by
infrared
spectroscopic
ellipsometry
GaN外延膜的红外椭偏光谱研究
Deposition
and
erosion
study
on
amorphous
hydrocarbon
films
by
in
situ
ellipsometry
用在线椭偏仪研究非晶碳氢膜沉积和刻蚀过程
Application
of
ellipsometry
in
researches
of
biomedicine
椭圆偏振术在生物医学研究中的应用
The
Refractive
Index
Measurement
of
Polymer
Films
with
Ellipsometry
椭偏法测试聚合物薄膜折射率的研究
Oriented
Immobilization
of Human IgG by
Protein
A
on
Imaging
Ellipsometry
Biosensor
A蛋白定向固定抗体用于椭偏光学生物传感器免疫检测
An Overview
and
Prospect
on
Modern
Spectroscopic
Ellipsometry
现代椭偏光谱学的回顾与展望
Ellipsometry
design
and
data
analysis
of the
monitoring
system
of
thin
wire
on-line
measuring
椭偏法细丝在线监测系统设计及数据分析
Improving
the
precision
of
optical
parameters
of
thin films
in
ellipsometry
by
using
the
modified
Simulated
-
Annealing
data processing
使用修正的模拟退火数据处理以提高椭偏测量中薄膜参数的精度
1·According to comparing with simulation annealing algorithm the paper introduce very fast simulation annealing algorithm and use VFSA to compute the ellipsometry data.
对比模拟退火算法介绍了非常快速模拟退火算法的流程,并使用非常模拟退火算法计算了椭偏数据。